Machine vision for defect detection and recognition has evolved from classical image‐processing workflows—such as thresholding, edge detection and template matching—to sophisticated deep learning ...
Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results